This illustration shows the Focused Ion Beam (FIB) milling process, a precise method for shaping materials on a nanoscale. A focused beam of gallium ions (depicted as a blue arrow) sculpts a surface ...
Focused Ion Beam (FIB) systems utilize a finely focused beam of gallium ions operated at low-beam currents for imaging and at high-beam currents for site-specific milling. Their versatility makes them ...
Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure The Helios 5 Hydra DualBeam (plasma ...
DualBeam focused ion beam scanning electron microscope, or FIB-SEM, offers unparalleled capabilities for gallium-free sample preparation, large-volume 3D characterization and high precision ...
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