Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure The Helios 5 Hydra DualBeam (plasma ...

Scanning Electron Microscopy (SEM) is a type of electron microscopy that uses a focused beam of high-energy electrons to generate detailed images of the surface of solid specimens. These images can ...

The built-in Ar + /Xe + beam helps prepare uniform, ultra-thin, low damage TEM lamellae easily, even on the most complex materials.

Thermo Scientific Scios 2 Dual-beam Focus Ion Beam/ Scanning Electron Microscope (DB FIB/SEM) equipped with ...

The 3D electron microscopy imaging is available using Serial Block Face (SB-EM) and Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) or Electron Tomography (ET) Electron tomography is TEM based ...

The scanning electron microscope (SEM) is a valuable tool for understanding what is happening to a material or biological ...

The technique involves directing a focused beam of electrons onto a sample and ... thanks to the fine electron probe it utilizes. Scanning Transmission Electron Microscopy (STEM) and Transmission ...

make the scanning electron microscope one of the most useful instruments in research today. The SEM is an instrument that produces a largely magnified image by using electrons instead of light to form ...

Description: CIQTEK DB500 is a Field Emission Scanning Electron Microscope with a Focused Ion Beam column for nano analysis and specimen preparation, which is applied with “SuperTunnel” technology, ...

A Scanning Electron Microscope uses a targeted beam of high-energy electrons on a test sample to produce an image or detect specific details. Electron-sample interactions can reveal a lot about a ...

Equipped with the Gatan 3View system with the ability to obtain in situ 3D data at remarkably fine depth resolution by means of Serial Block-Face Scanning. Zeiss Crossbeam 550 with GEMINI II electron ...