If the product requires wafer level testing, then more hardware is needed. In addition to a manual test rig, I will also have been designing a probe card, which will connect to the ATE head with a ...

A new technical paper titled “Design and Implementation of Test Infrastructure for Higher Parallel Wafer Level Testing of ...

Slessor explained that probe-card demand is influenced by new design releases and associated wafer volumes, with low PC and mobile demand suppressing Foundry and Logic revenues. Brian Chin ...