Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure The Helios 5 Hydra DualBeam (plasma ...

NanoBuilder Software enables the precise design of intricate and large-scale nanostructures across various locations, accommodating the entire range of DualBeam (focused ion beam scanning electron ...

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What is Focused Ion Beam Milling? Focused ion beam (FIB) milling is a nanofabrication technique that uses a focused beam of ions to precisely mill, etch, or deposit materials at the nanoscale. It ...

Cryo-ET/EM postdoctoral position immediately available in Zhu Lab at Case Western Reserve University   A postdoctoral position is immediately ...

The 3D electron microscopy imaging is available using Serial Block Face (SB-EM) and Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) or Electron Tomography (ET) Electron tomography is TEM based ...

Engineered to provide comprehensive support, SEM-Base VI caters to a wide array of commercial Scanning Electron Microscopes ...