Focused ion beam (FIB) milling is a nanofabrication technique that uses ... Future advancements in FIB milling will focus on improving the resolution, throughput, and versatility of the technique. The ...

[Andrew] has been busy running a class on hardware reverse engineering this semester, and figured a great end for the class would be something extraordinarily challenging and amazingly powerful.

equipped with SuperX-EDS detector FEI Single Tilt Holder FEI Double Tilt Holder FEI Double Tilt Low-background EDS Holder Gatan 626 Cryo Holder Gatan High Field-of-view Single-tilt Tomography Holder ...

The microscope is equipped with Gallium - Focused Ion Beam (FIB) for 3D EM imaging. It features a large chamber (330 mm inner diameter, 270 mm height) with 18 configurable ports for optional ...

The U.S. Patent Office granted Patent No. US 12,191,469 B2 for Beam Global’s PCC™ spacer product, which introduces an innovative manufacturing process that prevents thermal runaway propagation in ...