Focused ion beam (FIB) milling is a nanofabrication technique that uses ... Future advancements in FIB milling will focus on improving the resolution, throughput, and versatility of the technique. The ...
equipped with SuperX-EDS detector FEI Single Tilt Holder FEI Double Tilt Holder FEI Double Tilt Low-background EDS Holder Gatan 626 Cryo Holder Gatan High Field-of-view Single-tilt Tomography Holder ...
The HZDR team is utilizing its Institute of Ion Beam Physics and Materials Research ... Donor spin qubits, the focus of this project, offer greater stability against environmental perturbations ...