European consortium for new quantum frontiers get 3.2 million euros from EU to boost silicon-based quantum technologies.
Focused Ion Beam (FIB) systems utilize a finely focused beam of gallium ions operated at low-beam currents for imaging and at high-beam currents for site-specific milling. Their versatility makes them ...
What is Focused Ion Beam Milling? Focused ion beam (FIB) milling is a nanofabrication technique that uses a focused beam of ions to precisely mill, etch, or deposit materials at the nanoscale. It ...
Researchers are leveraging the established silicon infrastructure to pioneer donor spin qubits for quantum computing. The ...
[Andrew] has been busy running a class on hardware reverse engineering this semester, and figured a great end for the class would be something extraordinarily challenging and amazingly powerful.
an ultra-high-resolution analytical focused ion beam scanning electron microscopy (FIB-SEM) system for a variety of samples, including magnetic and non-conductive materials. The Scios 2 DualBeam is ...
Description: CIQTEK DB500 is a Field Emission Scanning Electron Microscope with a Focused Ion Beam column for nano analysis and specimen preparation, which is applied with “SuperTunnel” technology, ...
The 3D electron microscopy imaging is available using Serial Block Face (SB-EM) and Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) or Electron Tomography (ET) Electron tomography is TEM based ...
Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure The eLINE Plus from Raith is the optimum ...
The CP-8000+ from COXEM is a sophisticated sample preparation tool that helps etch a cross-section of a sample with the help of an argon ion beam. This process prevents structural damage and physical ...