This illustration shows the Focused Ion Beam (FIB) milling process, a precise method for shaping materials on a nanoscale. A focused beam of gallium ions (depicted as a blue arrow) sculpts a surface ...

Focused Ion Beam (FIB) nanofabrication techniques ... These techniques utilize a finely focused beam of ions, typically gallium, to etch, mill, or implant materials, allowing for the creation ...

Abstract: A gallium (Ga) focused ion beam (FIB) has been applied increasingly to ‘site-specific’ preparation of cross-sectional samples for transmission electron microscopy (TEM), scanning TEM, ...

Focussed Ion Beam (FIB) is a microscopy technique in which a beam of ions can be used to destructively remove material through a process known as sputtering. Gallium ion dual beam systems are now ...

Additionally, the roadmap for focused ion beam technologies highlights the evolution of FIB instruments, which now utilize various ion species beyond gallium, including xenon. This expansion ...

Loughborough Materials Characterisation Centre has a wealth of experience in Focused Ion Beam Microscopy. The centre has both gallium and xenon focused ion beam instruments. Our Xenon Plasma Focused ...