Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure The Helios 5 Hydra DualBeam (plasma ...
Helium ion microscopy (HIM) and focused ion beam (FIB) technologies are at ... secondary ion mass spectrometry (SIMS) with FIB-scanning electron microscopy (SEM) instruments.
Scanning Electron Microscopy (SEM) is a type of electron microscopy that uses a focused beam of high-energy electrons to generate detailed images of the surface of solid specimens. These images can ...
The built-in Ar + /Xe + beam helps prepare uniform, ultra-thin, low damage TEM lamellae easily, even on the most complex materials.
Thermo Scientific Scios 2 Dual-beam Focus Ion Beam/ Scanning Electron Microscope (DB FIB/SEM) equipped with ...
The 3D electron microscopy imaging is available using Serial Block Face (SB-EM) and Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) or Electron Tomography (ET) Electron tomography is TEM based ...
The technique involves directing a focused beam of electrons onto a sample and ... thanks to the fine electron probe it utilizes. Scanning Transmission Electron Microscopy (STEM) and Transmission ...
Environmental Scanning Electron Microscopy (ESEM ... is the analysis of fluid dynamics within the microscope's environment. A study focused on slip flow analysis in an experimental chamber ...
Much like the traditional scanning ... energy beam interacts with air and hydrocarbons on the surface of the specimen, "pasting" the products onto parts in the column. This process eventually spoils ...
A Scanning Electron Microscope uses a targeted beam of high-energy electrons on a test sample to produce an image or detect specific details. Electron-sample interactions can reveal a lot about a ...
Equipped with the Gatan 3View system with the ability to obtain in situ 3D data at remarkably fine depth resolution by means of Serial Block-Face Scanning. Zeiss Crossbeam 550 with GEMINI II electron ...
APT tips were then produced from the pyrite framboids using a scanning electron microscope equipped with a focused ion beam at the Environmental Molecular Sciences Laboratory (EMSL), a Department ...